Beilstein J. Nanotechnol.2011,2, 15–27, doi:10.3762/bjnano.2.2
interactions can be performed in the intermittent contact regime in different environments. Such combination provides sensitive detection of the surface potential and capacitance gradient with nanometer-scale spatial resolution as it was verified on self-assemblies of fluoroalkanes and a metal alloy. The KFM
selective swelling of components.
Keywords: atomic force microscopy; fluoroalkanes; Kelvin force microscopy; surface potential; Introduction
Atomic force microscopy (AFM) applications include high-resolution imaging, probing of local materials properties and compositional mapping of heterogeneous
contact mode and provide high-resolution maps of surface potential. This approach will be shortly described and its functionality will be proved by the results obtained on model systems: Self-assemblies of fluoroalkanes and metal alloys. The verification of novel approaches is specifically important in
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Figure 1:
Sketch illustrating implementation of Kelvin force microscopy in the AM–FM mode. Two servo-loops, w...