Helium ion microscope – secondary ion mass spectrometry for geological materials

• Matthew R. Ball,
• Richard J. M. Taylor,
• Joshua F. Einsle,
• Fouzia Khanom,
• Christelle Guillermier and
• Richard J. Harrison

Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133

• well as practicalities for geological sample analyses of Li alongside a discussion of potential geological use cases of the HIM–SIMS instrument. Keywords: geoscience; helium ion microscopy (HIM); lithium; secondary ion mass spectrometry (SIMS); Introduction The helium ion microscope (HIM) is a

• HIM–SIMS using Li as a test element. The choice of Li is particularly relevant for geoscience applications as it represents a key geological resource for green energy storage, a challenge to the commonly used scanning electron microscope (SEM)-based microanalysis methods, which rely on energy

Active and fast charge-state switching of single NV centres in diamond by in-plane Al-Schottky junctions

• Christoph Schreyvogel,
• Vladimir Polyakov,
• Sina Burk,
• Helmut Fedder,
• Andrej Denisenko,
• Felipe Fávaro de Oliveira,
• Ralf Wunderlich,
• Jan Meijer,
• Verena Zuerbig,
• Jörg Wrachtrup and
• Christoph E. Nebel

Beilstein J. Nanotechnol. 2016, 7, 1727–1735, doi:10.3762/bjnano.7.165

• , University of Stuttgart, 70569 Stuttgart, Germany Department of Physics and Geoscience, University of Leipzig, 04103 Leipzig, Germany Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany 10.3762/bjnano.7.165 Abstract In this paper, we demonstrate an active and fast control of the charge