Beilstein J. Nanotechnol.2010,1, 21–23, doi:10.3762/bjnano.1.4
small statistical significance like in case of High Resolution Transmission Electron Microscopy (HR-TEM) and Spin Polarized Scanning Tunneling Microscopy (SP-STM) or the necessary lateralresolution is only on the verge of being approached as in case of synchrotron-based microscopy methods like