High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

• John Melcher,
• David Martínez-Martín,
• Miriam Jaafar,
• Julio Gómez-Herrero and
• Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

• -varying deflection x(t) of the probe tip in the presence of tip–sample forces given by where ω0, Q0 and k are the unperturbed natural frequency, quality factor and stiffness of the probe, respectively, and F is the excitation force [19]. Fts is the tip–sample interaction force, which depends explicitly on

Models of the interaction of metal tips with insulating surfaces

• Thomas Trevethan,
• Matthew Watkins and
• Alexander L. Shluger

Beilstein J. Nanotechnol. 2012, 3, 329–335, doi:10.3762/bjnano.3.37

• Elastic constant: 148.7 N/m; natural frequency: 189000.0 Hz; setpoint amplitude: 5 nm; Q-factor: 10000.0. Macroscopic van der Waals: Hamaker constant: 0.999 eV; Tip radius: 18.0 nm (a) Side-on view of the structure of the Cr and W cluster tip models. (b) The structure of the periodic Cr tip model. (a