Distance dependence of near-field fluorescence enhancement and quenching of single quantum dots

• Volker Walhorn,
• Jan Paskarbeit,
• Heinrich Gotthard Frey,
• Alexander Harder and
• Dario Anselmetti

Beilstein J. Nanotechnol. 2011, 2, 645–652, doi:10.3762/bjnano.2.68

• dependence of Γexc was taken into consideration. a) Schematic image of the combined TIRFM–AFM setup. The AFM is placed on top of an inverted microscope. The subnanometer spatial resolution of the AFM piezo drive allows precise positioning relative to the sample surface. The incident laser is directed towards

Nanostructured, mesoporous Au/TiO₂ model catalysts – structure, stability and catalytic properties

• Matthias Roos,
• Dominique Böcking,
• Kwabena Offeh Gyimah,
• Gabriela Kucerova,
• Joachim Bansmann,
• Johannes Biskupek,
• Ute Kaiser,
• Nicola Hüsing and
• R. Jürgen Behm

Beilstein J. Nanotechnol. 2011, 2, 593–606, doi:10.3762/bjnano.2.63

• quadrupole mass spectrometer (QMS). A triple-axis, high precision, sample stage allows for free (relative) positioning of the sample underneath the Ti cap, at any lateral position on the sample surface (cf. Figure 1). For the measurements, the pressure in the reaction chamber was varied between 0.5 and 5

Superhydrophobic surfaces of the water bug Notonecta glauca: a model for friction reduction and air retention

• Petra Ditsche-Kuru,
• Erik S. Schneider,
• Jan-Erik Melskotte,
• Martin Brede,
• Alfred Leder and
• Wilhelm Barthlott

Beilstein J. Nanotechnol. 2011, 2, 137–144, doi:10.3762/bjnano.2.17

• microtrichia cover the special shape of the two different seta-types seems to contribute to this remarkable property. The angular positioning of the setae in the direction of flow leads to an increased contact area between setae and water when the setae are bent by increased pressure due to pressure

Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle–substrate chemistry and morphology, and of operating conditions

• Samer Darwich,
• Karine Mougin,
• Akshata Rao,
• Enrico Gnecco,
• Shrisudersan Jayaraman and
• Hamidou Haidara

Beilstein J. Nanotechnol. 2011, 2, 85–98, doi:10.3762/bjnano.2.10

• Science Center Road, Corning, NY 14831, USA 10.3762/bjnano.2.10 Abstract One key component in the assembly of nanoparticles is their precise positioning to enable the creation of new complex nano-objects. Controlling the nanoscale interactions is crucial for the prediction and understanding of the

• the particles, we did not find any differences when manipulating ordered vs random distributed particles. Keywords: atomic force microscopy; intermolecular interaction; manipulation; nanoparticles; precise positioning; self-assembled monolayers; Introduction Nanotechnology, which aims at the ideal

• nanoscale objects (nano-objects), we mean using external force for positioning or assembling objects in two (2-D) or three (3-D) dimensions by twisting, bending, picking-and-placing, or pushing and pulling them [3]. Nanomanipulation is a complex 3-D problem. Because mechanical and chemical properties of

Review and outlook: from single nanoparticles to self-assembled monolayers and granular GMR sensors

• Alexander Weddemann,
• Inga Ennen,
• Anna Regtmeier,
• Camelia Albon,
• Annalena Wolff,
• Katrin Eckstädt,
• Nadine Mill,
• Michael K.-H. Peter,
• Jochen Mattay,
• Carolin Plattner,
• Norbert Sewald and
• Andreas Hütten

Beilstein J. Nanotechnol. 2010, 1, 75–93, doi:10.3762/bjnano.1.10

• results in a force onto the particles which entails the assembly close to air–liquid boundary. This allows for a controlled positioning of the particle monolayer within a specified target region (on top of magnetoresistive sensors, between contacts for measurements of electrical transport properties etc

Preparation and characterization of supported magnetic nanoparticles prepared by reverse micelles

• Ulf Wiedwald,
• Luyang Han,
• Johannes Biskupek,
• Ute Kaiser and
• Paul Ziemann

Beilstein J. Nanotechnol. 2010, 1, 24–47, doi:10.3762/bjnano.1.5

• plasma chamber together with its transfer system can be hooked up to a high-field end station at beam line PM3 at BESSY II synchrotron facility (Berlin), Germany and the 350 keV ion accelerator at Ulm University allowing full in situ sample manipulation. After positioning the micelle containing substrate