Search for "scanning ion conductance microscopy (SICM)" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.
Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73
Beilstein J. Nanotechnol. 2021, 12, 242–256, doi:10.3762/bjnano.12.20