Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study

• Shafaq Kazim,
• Rahul Parmar,
• Maryam Azizinia,
• Matteo Amati,
• Muhammad Rauf,
• Andrea Di Cicco,
• Seyed Javid Rezvani,
• Dario Mastrippolito,
• Luca Ottaviano,
• Tomasz Klimczuk,
• Luca Gregoratti and
• Roberto Gunnella

Beilstein J. Nanotechnol. 2025, 16, 749–761, doi:10.3762/bjnano.16.58

• oxidation or the introduction of surface vacancies, a novel and versatile approach is unveiled for the development of low-dimensional multifunctional nanodevices. Keywords: chemical mapping; CrX3; Kelvin probe force microscopy; mechanical exfoliation; scanning photoelectron microscopy (SPEM); two

• temperature could be further increased by applying uniaxial strain [17][27]. In the present study, we examined the surface modifications that occur in thin layers of exfoliated CrCl3 (approximately 1 to 20 ML) by using scanning photoelectron microscopy (SPEM). We collected the chemical maps and spectra of the

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

• Matteo Amati,
• Alexey S. Shkvarin,
• Alexander I. Merentsov,
• Alexander N. Titov,
• María Taeño,
• David Maestre,
• Sarah R. McKibbin,
• Zygmunt Milosz,
• Ana Cremades,
• Rainer Timm and
• Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

• several improvements have been developed at synchrotron light facilities where unique properties of X-ray radiation can be found. Scanning photoelectron microscopy (SPEM) combines XPS analysis with lateral resolution; chemical imaging as well as XPS spectroscopy at nanoscale sized areas can be performed

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

• Peter Guttmann and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2015, 6, 595–604, doi:10.3762/bjnano.6.61

• lens which is in most cases a zone plate (ZP). In a scanning transmission X-ray microscopy (STXM) the transmitted X-rays are detected. Scanning photoelectron microscopy (SPEM) is a method where the emitted photoelectrons are kinetic-energy-resolved detected. Additionally, fluorescence photons emitted