Optimal geometry for a quartz multipurpose SPM sensor

• Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

• ; mechanical vibrations; scanning probe microscopy; scanning tunnelling microscopy; Introduction The heart of any scanning probe microscope (SPM) is its sensory probe. For a scanning tunnelling microscope (STM) this is simply an electrically conducting wire with an atomically sharp apex. For atomic force

Pinch-off mechanism in double-lateral-gate junctionless transistors fabricated by scanning probe microscope based lithography

• Farhad Larki,
• Arash Dehzangi,
• Alam Abedini,
• Ahmad Makarimi Abdullah,
• Elias Saion,
• Sabar D. Hutagalung,
• Mohd N. Hamidon and
• Jumiah Hassan

Beilstein J. Nanotechnol. 2012, 3, 817–823, doi:10.3762/bjnano.3.91

• field emanating from the gates creates an electric field perpendicular to the current, toward the bottom of the channel, which provides the electrostatic squeezing of the current. Keywords: AFM nanolithography; junctionless transistors; pinch-off; scanning probe microscope; simulation; Introduction

• resistivity of 13.5–22.5 Ω cm [16], by using scanning probe microscope (SPM) (SPI3800N/4000). The buried oxide layer in the SOI wafer was used as an insulator between the device and the handle silicon wafer, and also as the etch-stop in the wet-etching process. All predesigned oxide masks were fabricated in

• time causes an unavoidable scattering effect and subthreshold swing (SS) fluctuation. The latter case can justify new experiments with low doping concentration for JLTs. The fabrication of low-doped single-lateral-gate (SG) and double-lateral-gate junctionless transistors (DGJLT) by scanning probe

Forming nanoparticles of water-soluble ionic molecules and embedding them into polymer and glass substrates

• Stella Kiel,
• Olga Grinberg,
• Nina Perkas,
• Jerome Charmet,
• Herbert Kepner and
• Aharon Gedanken

Beilstein J. Nanotechnol. 2012, 3, 267–276, doi:10.3762/bjnano.3.30

• morphology of the glasses coated with NaCl/CuSO4/KI nanoparticles was studied by SEM using the JEOL-JSN 7000F device. The AFM measurements and imaging were carried out with a Nanoscope V Multimode scanning probe microscope (Digital Instruments, Santa Barbara, CA). All the images were obtained in contact mode

Direct-write polymer nanolithography in ultra-high vacuum

• Woo-Kyung Lee,
• Minchul Yang,
• Arnaldo R. Laracuente,
• William P. King,
• Lloyd J. Whitman and
• Paul E. Sheehan

Beilstein J. Nanotechnol. 2012, 3, 52–56, doi:10.3762/bjnano.3.6

• immersed into the droplet, dried on a hot plate at 60 °C and then loaded into the UHV chamber. (a) Schematic of the tDPN process which uses a heated scanning probe microscope tip to deposit polymer from a moving tip. (b) Leaving the tip in contact, deposition is started and stopped by turning the heat on

Distinction of nucleobases – a tip-enhanced Raman approach

• Regina Treffer,
• Xiumei Lin,
• Elena Bailo,
• Tanja Deckert-Gaudig and
• Volker Deckert

Beilstein J. Nanotechnol. 2011, 2, 628–637, doi:10.3762/bjnano.2.66

• with reasonable costs and expenditure of time [3]. Tip-enhanced Raman scattering (TERS) is the combination of Raman spectroscopy with a scanning probe microscope, most often an atomic force microscope (AFM). A metal nanoparticle at the apex of the AFM tip leads to a large enhancement of the

Switching adhesion forces by crossing the metal–insulator transition in Magnéli-type vanadium oxide crystals

• Bert Stegemann,
• Matthias Klemm,
• Siegfried Horn and
• Mathias Woydt

Beilstein J. Nanotechnol. 2011, 2, 59–65, doi:10.3762/bjnano.2.8

• chamber houses a variable temperature scanning probe microscope (Omicron Nanotechnology, Germany), which allows AFM measurements at sample temperatures in the range from 120 K to 1000 K by either cooling with liquid N2 or radiative heating. Temperature measurements were made with a thermocouple attached

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• conditions because nowadays lock-in amplifiers are an essential part of the electronics in scanning probe microscopes. AFM-based electrostatic force measurements were performed under ambient conditions with an Agilent 5500 scanning probe microscope equipped with a MAC III unit, which has three lock-in

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• defects. Experimental setup: dual mode NC-AFM/STM The employed scanning probe microscope, i.e., a NC-AFM in combination with a STM, was optimized for surface investigation on the atomic scale with spatial resolution of some picometers. Note that NC-AFM is frequently referred to as frequency modulation