Kelvin probe force microscopy in liquid using electrochemical force microscopy

• Liam Collins,
• Stephen Jesse,
• Jason I. Kilpatrick,
• Alexander Tselev,
• M. Baris Okatan,
• Sergei V. Kalinin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2015, 6, 201–214, doi:10.3762/bjnano.6.19

• level, few techniques are capable of operating below the micron length scale [11]. Scanning probe microscopy (SPM) techniques are uniquely positioned to probe structure on nano- to micrometer length scales and can do so under vacuum, ambient or liquid environments. Thus, the development of SPM

Advanced atomic force microscopy techniques II

• Thilo Glatzel,
• Ricardo Garcia and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2014, 5, 2326–2327, doi:10.3762/bjnano.5.241

• surface reconstructions and nanoscale geometries. New functionality is achieved by combinations of nanoscale materials or by structuring their surfaces. The unrivaled tools for measurements of all kind of nanoscale properties are scanning probe microscopy (SPM) techniques, which were triggered by the

Control theory for scanning probe microscopy revisited

• Julian Stirling

Beilstein J. Nanotechnol. 2014, 5, 337–345, doi:10.3762/bjnano.5.38

• ; Introduction Scanning probe microscopy (SPM) imaging relies on feedback loops to maintain a constant interaction between the tip and the sample [1][2]. Many well known artefacts can arise from improper feedback settings [3][4][5]. Thus, for reliable SPM operation and analysis the characteristics and behaviour

The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope

• Christian Wagner,
• Norman Fournier,
• F. Stefan Tautz and
• Ruslan Temirov

Beilstein J. Nanotechnol. 2014, 5, 202–209, doi:10.3762/bjnano.5.22

• Future Information Technology, 52425 Jülich, Germany 10.3762/bjnano.5.22 Abstract Scanning probe microscopy (SPM) plays an important role in the investigation of molecular adsorption. The possibility to probe the molecule–surface interaction while tuning its strength through SPM tip-induced single

• rapid development of scanning probe microscopy (SPM) techniques, investigations of adsorbate–surface interactions on a single-molecule level have become possible [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. Especially interesting is the possibility of probing the molecule–surface

Noise performance of frequency modulation Kelvin force microscopy

• Heinrich Diesinger,
• Dominique Deresmes and
• Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

• microscope (UHV-VT-AFM). It is operated by a Nanonis scanning probe microscopy (SPM) controller entirely based on digital signal processing (DSP). The probe that was used in these experiments is a platinum-iridium coated Nanosensors Point Probe Plus EFM tip with a spring constant between 1 and 3 N/m. Its

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

• Sidney R. Cohen and
• Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

• works [16][17][18][19] paved the way for two new point-probe nanomechanical testing devices which were developed in the 1980s – instrumented nanoindentation (INI, also known as depth-sensing instrumentation) [19][20] and atomic force microscopy (AFM, also known by the more general term of scanning probe

• microscopy, SPM) [21]. These developments facilitated the measurement of mechanical properties of very small volumes of materials, opening new avenues of research. Reducing dimensions to the nanoscale gave birth to new paradigms in mechanical measurements and interpretation: In addition to the increased

A look underneath the SiO₂/4H-SiC interface after N₂O thermal treatments

• Patrick Fiorenza,
• Filippo Giannazzo,
• Lukas K. Swanson,
• Alessia Frazzetto,
• Simona Lorenti,
• Mario S. Alessandrino and
• Fabrizio Roccaforte

Beilstein J. Nanotechnol. 2013, 4, 249–254, doi:10.3762/bjnano.4.26

• Scanning Probe Microscopy (SPM) measurements were carried out by using a Digital Instrument D3100 equipped with the Nanoscope® V controller. Local resistance measurements were carried out by using the scanning spreading resistance module (SSRM) [18][19], and cross-sectional local active-doping profiling

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

• Mehmet Z. Baykara,
• Omur E. Dagdeviren,
• Todd C. Schwendemann,
• Harry Mönig,
• Eric I. Altman and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

• the second part applies the findings to determine the optimum strategies for extracting reliable information on atomic-scale chemical and physical properties of sample surfaces. Part I: Artifacts in force-field spectroscopy measurements Drift Virtually all atomic-scale scanning probe microscopy (SPM

Towards multiple readout application of plasmonic arrays

• Dana Cialla,
• Karina Weber,
• René Böhme,
• Uwe Hübner,
• Henrik Schneidewind,
• Matthias Zeisberger,
• Roland Mattheis,
• Robert Möller and
• Jürgen Popp

Beilstein J. Nanotechnol. 2011, 2, 501–508, doi:10.3762/bjnano.2.54

• , the signal enhancement in SERS and SEF is characterized by different dependencies on the distance between the analyte and metal surface. In order to establish rules for an analyte–metal-surface, distance dependent, signal enhancement, scanning probe microscopy (SPM)-based measurements in combination

Infrared receptors in pyrophilous (“fire loving”) insects as model for new un-cooled infrared sensors

• David Klocke,
• Anke Schmitz,
• Helmut Soltner,
• Herbert Bousack and
• Helmut Schmitz

Beilstein J. Nanotechnol. 2011, 2, 186–197, doi:10.3762/bjnano.2.22

• . Experimental Morphological methods used are all based on well established light and electron microscopical procedures. Mechanical tests were conducted in a nanomechanical test system capable of normal loading as well as in situ scanning probe microscopy (SPM) (TriboScope; Hysitron, Minneapolis, USA

Scanning probe microscopy and related methods

• Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

• . Scanning probe microscopy (SPM) uses probing tips to map properties, such as topography, local adhesive forces, elasticity, friction or magnetic properties. In the emerging fields of nanoscience and nanotechnology these types of microscopes help to characterize the nanoworld. In addition, local probes can