Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

• Samuel Gelman,
• Irit Rosenhek-Goldian,
• Nir Kampf,
• Marek Patočka,
• Maricarmen Rios,
• Marcos Penedo,
• Georg Fantner,
• Amir Beker,
• Sidney R. Cohen and
• Ido Azuri

Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83

• 52 pairs of low- and high-resolution images of a Celgard® 2400 membrane (Celgard, LLC - North Carolina, USA). Images of 5 μm × 5 µm were captured at 8–10 Hz scanning speed, using a fast-scan AFM system, operated by using photothermal off-resonance (at 10 kHz) tapping [35] and small cantilevers, which

Signal enhancement in cantilever magnetometry based on a co-resonantly coupled sensor

• Julia Körner,
• Christopher F. Reiche,
• Thomas Gemming,
• Bernd Büchner,
• Gerald Gerlach and
• Thomas Mühl

Beilstein J. Nanotechnol. 2016, 7, 1033–1043, doi:10.3762/bjnano.7.96

• cantilevers with rectangular cross section, similar considerations can be applied to other cantilever geometries. However, ultrathin and small cantilevers are difficult to produce and handle and furthermore still need a feature to allow for the use of optical detection methods. This is usually realized by a

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale

• topography as well as mechanical properties. Nevertheless, instrument bandwidth limitations on cantilever excitation and readout have restricted the ability of multifrequency techniques to fully benefit from small cantilevers. We present an approach for cantilever excitation and deflection readout with a

• ; small cantilevers; Introduction The atomic force microscope (AFM) has developed into an extremely useful and versatile tool for nanometre-scale visualization and mechanical characterization. In recent years, several methods have been developed for simultaneous measurement of topographical and

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

• Blake W. Erickson,
• Séverine Coquoz,
• Jonathan D. Adams,
• Daniel J. Burns and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

• modified Multimode system with an E-scanner (Bruker Nano: Santa Barbara, CA, USA). A customized small-lever head allowed for the use of small cantilevers (SCL-Sensor.Tech., Vienna, Austria). The cantilever had a resonance frequency in fluid of 266.49 kHz, a spring constant of 0.54 N/m and a Q value of 2.68