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Search for "structural characterization" in Full Text gives 78 result(s) in Beilstein Journal of Nanotechnology.

Parallel- and serial-contact electrochemical metallization of monolayer nanopatterns: A versatile synthetic tool en route to bottom-up assembly of electric nanocircuits

  • Jonathan Berson,
  • Assaf Zeira,
  • Rivka Maoz and
  • Jacob Sagiv

Beilstein J. Nanotechnol. 2012, 3, 134–143, doi:10.3762/bjnano.3.14

Graphical Abstract
  • /monolayer contact electrodes. Work toward the realization of such circuits and their electrical–structural characterization is currently in progress. As far as basic electrochemical aspects are concerned, it is of interest to note that the present findings offer direct experimental support to the recent
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Published 16 Feb 2012

Nanoscaled alloy formation from self-assembled elemental Co nanoparticles on top of Pt films

  • Luyang Han,
  • Ulf Wiedwald,
  • Johannes Biskupek,
  • Kai Fauth,
  • Ute Kaiser and
  • Paul Ziemann

Beilstein J. Nanotechnol. 2011, 2, 473–485, doi:10.3762/bjnano.2.51

Graphical Abstract
  • lower than for CoPt in the L10 phase. The Co volume fraction in our specimens typically amounts to few parts per thousand or less. Therefore, a thorough structural characterization of the alloy formation with standard laboratory equipment is not practical. Instead, we probe the magnetic signatures of
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Published 23 Aug 2011

Magnetic coupling mechanisms in particle/thin film composite systems

  • Giovanni A. Badini Confalonieri,
  • Philipp Szary,
  • Durgamadhab Mishra,
  • Maria J. Benitez,
  • Mathias Feyen,
  • An Hui Lu,
  • Leonardo Agudo,
  • Gunther Eggeler,
  • Oleg Petracic and
  • Hartmut Zabel

Beilstein J. Nanotechnol. 2010, 1, 101–107, doi:10.3762/bjnano.1.12

Graphical Abstract
  • other hand is less well studied. The aim of our present investigation is to shed light on these various interactions. Results and Discussion Structural characterization Hexagonal close packing of self-assembled NPs as a result of the spin-coating process was confirmed by means of atomic force microscopy
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Published 01 Dec 2010
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