Emerging frontiers in atomic force microscopy

Atomic force microscopy continues to expand from an imaging technique into a quantitative and highly versatile tool for probing structure, forces, dynamics, functionality, and reactivity at the atomic and molecular scale. This thematic issue will highlight recent advances in experimental, theoretical, and instrumental AFM research, with particular emphasis on non-contact AFM and related scanning probe methods.

We welcome contributions on high-resolution imaging and spectroscopy, quantitative force and potential mapping, functionalized tips and contrast mechanisms, atomic- and molecular-scale manipulation, on-surface synthesis and molecular electronics, quantum, spin, charge, magnetic and optoelectronic phenomena, as well as AFM studies of insulators, oxides, minerals, two-dimensional materials, and solid–liquid or electrochemical interfaces. Submissions addressing new instrumentation, automation, machine learning, simulation methods, and synergies with complementary techniques such as STM, KPFM, optical, infrared, THz, and time-resolved spectroscopies are particularly encouraged.

The issue aims to provide a broad view of how modern AFM is opening new frontiers in nanoscale science, from fundamental interaction mechanisms to functional materials and emerging applications.

Submission deadline: February 28, 2027