Lateral ordering of PTCDA on the clean and the oxygen pre-covered Cu(100) surface investigated by scanning tunneling microscopy and low energy electron diffraction

• Stefan Gärtner,
• Benjamin Fiedler,
• Oliver Bauer,
• Antonela Marele and
• Moritz M. Sokolowski

Beilstein J. Org. Chem. 2014, 10, 2055–2064, doi:10.3762/bjoc.10.213

• ) surface [referred to as (√2 × 2√2)R45° – 2O/Cu(100)] by scanning tunneling microscopy (STM) and low energy electron diffraction (LEED). Our results confirm the (4√2 × 5√2)R45° superstructure of PTCDA/Cu(100) reported by A. Schmidt et al. [J. Phys. Chem. 1995, 99,11770–11779]. However, contrary to Schmidt

• to that of PTCDA bulk lattice planes. Keywords: Cu(100); LEED; PTCDA; STM; template; thin organic films; Introduction Interfaces between organic semiconductors and metals have gained large interest because they are present in many applications, e.g., organic field-effect transistors [1] or organic

• energy electron diffraction (LEED) measurements. Scanning tunneling microscopy (STM) data has not been reported yet. Therefore, the aim of our combined LEED and STM investigation was twofold: on the one hand to clarify the superstructure of PTCDA on Cu(100), and on the other hand to gain new information