Cite the Following Article
Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process
Nahid Hosseini, Matthias Neuenschwander, Oliver Peric, Santiago H. Andany, Jonathan D. Adams and Georg E. Fantner
Beilstein J. Nanotechnol. 2019, 10, 2357–2363.
https://doi.org/10.3762/bjnano.10.226
How to Cite
Hosseini, N.; Neuenschwander, M.; Peric, O.; Andany, S. H.; Adams, J. D.; Fantner, G. E. Beilstein J. Nanotechnol. 2019, 10, 2357–2363. doi:10.3762/bjnano.10.226
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- Andany, S. H.; Hlawacek, G.; Hummel, S.; Brillard, C.; Kangül, M.; Fantner, G. E. An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization. Beilstein journal of nanotechnology 2020, 11, 1272–1279. doi:10.3762/bjnano.11.111
- Alunda, B. O.; Lee, Y. J. Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy. Sensors (Basel, Switzerland) 2020, 20, 4784. doi:10.3390/s20174784
