Cite the Following Article
Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process
Nahid Hosseini, Matthias Neuenschwander, Oliver Peric, Santiago H. Andany, Jonathan D. Adams and Georg E. Fantner
Beilstein J. Nanotechnol. 2019, 10, 2357–2363.
https://doi.org/10.3762/bjnano.10.226
How to Cite
Hosseini, N.; Neuenschwander, M.; Peric, O.; Andany, S. H.; Adams, J. D.; Fantner, G. E. Beilstein J. Nanotechnol. 2019, 10, 2357–2363. doi:10.3762/bjnano.10.226
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Presentation Graphic
| Picture with graphical abstract, title and authors for social media postings and presentations. | ||
| Format: PNG | Size: 1.1 MB | Download |
Citations to This Article
Up to 20 of the most recent references are displayed here.
Scholarly Works
- de Winter, J.; Manzaneque, T.; Krishna Ghatkesar, M. Damping of 3D-printed polymer microbeam resonators. Journal of Micromechanics and Microengineering 2023, 34, 15004–015004. doi:10.1088/1361-6439/ad08ef
- Nathani, M. U.; Nazemi, H.; Love, C.; Lopez, Y. B.; Swaminathan, S.; Emadi, A. Capacitive Based Micromachined Resonators for Low Level Mass Detection. Micromachines 2020, 12, 13. doi:10.3390/mi12010013
- Andany, S. H.; Hlawacek, G.; Hummel, S.; Brillard, C.; Kangül, M.; Fantner, G. E. An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization. Beilstein journal of nanotechnology 2020, 11, 1272–1279. doi:10.3762/bjnano.11.111
- Alunda, B. O.; Lee, Y. J. Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy. Sensors (Basel, Switzerland) 2020, 20, 4784. doi:10.3390/s20174784
