Advanced atomic force microscopy II
In this thematic issue, we present state-of-the-art research on non-contact atomic force microscopy (nc-AFM) with a focus on high resolution, the development of advanced scanning and spectroscopy techniques, simulation and theoretical modeling of the tip–sample interactions, as well as the application of nc-AFM to new materials.
Potential contributions are expected to be focused on the following topics:
- Novel instrumentation and techniques in AFM
- Atomic-resolution imaging on insulating substrates, semiconductors, and metals
- High-resolution imaging of molecules, clusters and biological systems
- Atomic- and molecular-scale manipulation
- Simultaneous force and tunneling current spectroscopy
- High-resolution imaging and spectroscopy in liquid environments
- Theoretical analysis of contrast mechanisms, forces and tunneling phenomena
- 2D and 3D force-field mapping
- Small amplitude and lateral force measurements using dynamic methods
- Mechanisms and understanding of damping and energy dissipation
- Nanoscale measurements of charges, work function, and magnetic properties
- Theoretical aspects of scanning probe techniques
Additional articles will be published here soon.
- Full Research Paper
- Published 25 Sep 2018
-
PDF -
Album-
![]()
Figure 1: (a) Scanning electron microscopy image of a sensor realization consisting of a silicon microcantile...
-
![]()
Figure 2: Calculated microcantilever amplitude response curve of the co-resonantly coupled system based on th...
-
![]()
Figure 3: (a) Resonance amplitudes of both resonance peaks of the coupled system calculated for the microcant...
-
![]()
Figure 4: This diagram represents the necessary calculation steps to determine the effective spring constant
![[Graphic 7]](/bjnano/content/inline/2190-4286-9-237-i43.svg?max-width=637&scale=1.18182)
...
-
![]()
Figure 5: Effective spring constants for both resonance peaks of the coupled system in dependence on the eige...
-
![]()
Figure 6: Effective quality factor for both resonance peaks of the coupled system in dependence on the eigenf...
-
![]()
Figure 7: Qualitative behaviour of the effective quality factor for both resonance peaks of the coupled syste...
-
-
Supp. Info
- Full Research Paper
- Published 30 Jan 2019
-
PDF -
Album-
![]()
Figure 1: Adsorption of N2O molecules on the Au(111) substrate. (a) Overview STM image (100 mV, 10 pA, 50 × 5...
-
![]()
Figure 2: Tip functionalization with a N2O molecule. (a) STM image (100 mV, 10 pA, 6 × 6 nm2) demonstrating a...
-
![]()
Figure 3: Comparison of the calculated electrostatic potential projections of the CO (a) and N2O (b) tips obt...
-
![]()
Figure 4: Constant-current STM images of the co-adsorption of FePc and N2O molecules on a Au(111) surface (20...
-
![]()
Figure 5: (a) STM and AFM constant-height images of the FePc on Au(111) (1.7 × 1.7 nm2, Vb = 3 mV) obtained w...
-
-
Supp. Info
- Review
- Published 01 Mar 2019
-
PDF -
Album-
![]()
Figure 1: Illustration of ionic transport measurements in the time domain. (a) A conducting AFM tip is brough...
-
![]()
Figure 2: (a) AFM frequency shift response to stretched-exponential voltage pulses (from 0 to 5 V) with and w...
-
![]()
Figure 3: (a) Schematic illustration of the voltage-pulse averaging EFM technique: the top shows the applied ...
-
![]()
Figure 4: Measured tip–sample force as a function of the distance for a gold-coated tip over a grounded gold ...
-
![]()
Figure 5: “(a) Schematic of the experimental setup: (i) Computer requests a trigger at a defined phase of the...
-
![]()
Figure 6: Extracted FF-trEFM signals from numerical simulations of tip–sample interactions with a stretched-e...
-
![]()
Figure 7: “(a) Calibration curve for a range of characteristic times of exponential decay (τ) (inset shows a ...
-
![]()
Figure 8: “For three representative pulse times, we plot (A) cantilever amplitude; (B) cantilever drive volta...
-
![]()
Figure 9: “Experiments and simulations demonstrating subcycle time resolution in pk-EFM. (A) Subcycle voltage...
-
![]()
Figure 10: Synthetic data of cantilever deflection spectrum around the fundamental resonance frequency, ω0 =2π...
-
![]()
Figure 11: “Results from simulations and from the experimental validation for the proposed excitation schemes:...
-
-
Supp. Info
- Full Research Paper
- Published 15 Apr 2019
-
PDF -
Album-
![]()
Figure 1: (a) Principle of n- and p-type DSSCs showing opposite charge transfer directions. (b) Structures of...
-
![]()
Figure 2: The surface of NiO(001). (a) Large-scale topographic image of the NiO(001) crystal showing clean te...
-
![]()
Figure 3: (a) Large-scale topographic image showing that Cu-TCPP molecules form islands on the surface of NiO...
-
![]()
Figure 4: (a) Large-scale topographic image showing that C343 molecules form islands on the surface of NiO(00...
-
![]()
Figure 5: (a, b) CPD measurements of Cu-TCCP and C343 islands on the NiO(001) substrate, respectively (scan p...
-
-
Supp. Info
- Full Research Paper
- Published 17 May 2019
-
PDF -
Album-
![]()
Figure 1: Phase shift as a function of the tip–substrate distance z; calculated for a silicon substrate with V...
-
![]()
Figure 2: Substrate without dielectric layer and with dielectric layer. The dielectric layer allows the tip t...
-
![]()
Figure 3: Phase shift due to capacitive coupling as a function of the lift height for nanoparticles with 10 n...
-
![]()
Figure 4: a) Sketch of a MFM measurement of a dielectric layer with defined roughness (Rmax); b) Simulation f...
-
![]()
Figure 5: Schematic representation of the distance between tip and nanoparticle dipole during the interleave ...
-
![]()
Figure 6: Simulation of the MFM phase for a single SPION using a Gaussian topographic profile corresponding t...
-
![]()
Figure 7: Phase shift above nanoparticles (10 ± 2 nm) on dielectric layers of various thicknesses as a functi...
-
![]()
Figure 8: Calculated (
![[Graphic 2]](/bjnano/content/inline/2190-4286-10-106-i7.svg?max-width=637&scale=1.18182)
; black line) and measured phase shift for single nanoparticles with 10 ± 2 nm diameter...
-
![]()
Figure 9: Measurement of a single SPION with 10 ± 2 nm diameter on a silicon substrate with a dielectric laye...
-
![]()
Figure 10: Measurement of a single SPION with 12 ± 1 nm diameter on a silicon substrate recorded with an ASYMF...
-
-
Supp. Info
