In this thematic issue, we present state-of-the-art research on non-contact atomic force microscopy (nc-AFM) with a focus on high resolution, the development of advanced scanning and spectroscopy techniques, simulation and theoretical modeling of the tip–sample interactions, as well as the application of nc-AFM to new materials.

Potential contributions are expected to be focused on the following topics:

- Novel instrumentation and techniques in AFM
- Atomic-resolution imaging on insulating substrates, semiconductors, and metals
- High-resolution imaging of molecules, clusters and biological systems
- Atomic- and molecular-scale manipulation
- Simultaneous force and tunneling current spectroscopy
- High-resolution imaging and spectroscopy in liquid environments
- Theoretical analysis of contrast mechanisms, forces and tunneling phenomena
- 2D and 3D force-field mapping
- Small amplitude and lateral force measurements using dynamic methods
- Mechanisms and understanding of damping and energy dissipation
- Nanoscale measurements of charges, work function, and magnetic properties
- Theoretical aspects of scanning probe techniques

Additional articles will be published here soon.