Advanced atomic force microscopy II

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Editors
Dr. Milica Todorovic, Aalto University, Finland
Prof. Mehmet Z. Baykara, University of California Merced, USA
PD Dr. Thilo Glatzel, University of Basel, Switzerland
 

In this thematic issue, we present state-of-the-art research on non-contact atomic force microscopy (nc-AFM) with a focus on high resolution, the development of advanced scanning and spectroscopy techniques, simulation and theoretical modeling of the tip–sample interactions, as well as the application of nc-AFM to new materials.

Potential contributions are expected to be focused on the following topics:

- Novel instrumentation and techniques in AFM
- Atomic-resolution imaging on insulating substrates, semiconductors, and metals
- High-resolution imaging of molecules, clusters and biological systems
- Atomic- and molecular-scale manipulation
- Simultaneous force and tunneling current spectroscopy
- High-resolution imaging and spectroscopy in liquid environments
- Theoretical analysis of contrast mechanisms, forces and tunneling phenomena
- 2D and 3D force-field mapping
- Small amplitude and lateral force measurements using dynamic methods
- Mechanisms and understanding of damping and energy dissipation
- Nanoscale measurements of charges, work function, and magnetic properties
- Theoretical aspects of scanning probe techniques

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Effective sensor properties and sensitivity considerations of a dynamic co-resonantly coupled cantilever sensor

  • Julia Körner

Beilstein J. Nanotechnol. 2018, 9, 2546–2560, doi:10.3762/bjnano.9.237

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Published 25 Sep 2018

Nitrous oxide as an effective AFM tip functionalization: a comparative study

  • Taras Chutora,
  • Bruno de la Torre,
  • Pingo Mutombo,
  • Jack Hellerstedt,
  • Jaromír Kopeček,
  • Pavel Jelínek and
  • Martin Švec

Beilstein J. Nanotechnol. 2019, 10, 315–321, doi:10.3762/bjnano.10.30

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Published 30 Jan 2019

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

  • Aaron Mascaro,
  • Yoichi Miyahara,
  • Tyler Enright,
  • Omur E. Dagdeviren and
  • Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

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Published 01 Mar 2019

Comparing a porphyrin- and a coumarin-based dye adsorbed on NiO(001)

  • Sara Freund,
  • Antoine Hinaut,
  • Nathalie Marinakis,
  • Edwin C. Constable,
  • Ernst Meyer,
  • Catherine E. Housecroft and
  • Thilo Glatzel

Beilstein J. Nanotechnol. 2019, 10, 874–881, doi:10.3762/bjnano.10.88

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Published 15 Apr 2019

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

  • Alexander Krivcov,
  • Jasmin Ehrler,
  • Marc Fuhrmann,
  • Tanja Junkers and
  • Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

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Published 17 May 2019

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

  • Dominik Wrana,
  • Karol Cieślik,
  • Wojciech Belza,
  • Christian Rodenbücher,
  • Krzysztof Szot and
  • Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

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Published 02 Aug 2019

Ion mobility and material transport on KBr in air as a function of the relative humidity

  • Dominik J. Kirpal,
  • Korbinian Pürckhauer,
  • Alfred J. Weymouth and
  • Franz J. Giessibl

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

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Published 30 Oct 2019

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

  • Nahid Hosseini,
  • Matthias Neuenschwander,
  • Oliver Peric,
  • Santiago H. Andany,
  • Jonathan D. Adams and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

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Published 29 Nov 2019

A review of demodulation techniques for multifrequency atomic force microscopy

  • David M. Harcombe,
  • Michael G. Ruppert and
  • Andrew J. Fleming

Beilstein J. Nanotechnol. 2020, 11, 76–91, doi:10.3762/bjnano.11.8

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Published 07 Jan 2020

Implementation of data-cube pump–probe KPFM on organic solar cells

  • Benjamin Grévin,
  • Olivier Bardagot and
  • Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

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Published 12 Feb 2020

Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy

  • Daiki Katsube,
  • Shoki Ojima,
  • Eiichi Inami and
  • Masayuki Abe

Beilstein J. Nanotechnol. 2020, 11, 443–449, doi:10.3762/bjnano.11.35

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Published 10 Mar 2020

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

  • Berkin Uluutku and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

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Published 13 Mar 2020
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