Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

Aaron Mascaro, Yoichi Miyahara, Tyler Enright, Omur E. Dagdeviren and Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633. doi:10.3762/bjnano.10.62

Supporting Information

Supporting Information File 1: MATLAB code to simulate FF-trEFM measurements with a stretched exponential response.
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