Beilstein J. Nanotechnol. 2020, 11, 1361–1370. https://doi.org/10.3762/bjnano.11.120
Comparison of low- and high-coverage F4PEN on Ag(111), both HR-XPS and XSW results, full spectra of coverage-dependent XPS results, C 1s and F 1s core levels, full UPS survey spectra, XRD measurement and analysis of PFP on Ag(111) and a set of XSW measurements.
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Sabine Maier and Meike Stöhr