On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

Enrique A. López-Guerra and Santiago D. Solares
Beilstein J. Nanotechnol. 2020, 11, 1409–1418. https://doi.org/10.3762/bjnano.11.125

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On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges
Enrique A. López-Guerra and Santiago D. Solares
Beilstein J. Nanotechnol. 2020, 11, 1409–1418. https://doi.org/10.3762/bjnano.11.125

How to Cite

López-Guerra, E. A.; Solares, S. D. Beilstein J. Nanotechnol. 2020, 11, 1409–1418. doi:10.3762/bjnano.11.125

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