Helium ion microscope – secondary ion mass spectrometry for geological materials

Matthew R. Ball, Richard J. M. Taylor, Joshua F. Einsle, Fouzia Khanom, Christelle Guillermier and Richard J. Harrison

Beilstein J. Nanotechnol. 2020, 11, 1504–1515. https://doi.org/10.3762/bjnano.11.133

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