Cite the Following Article
Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis
Berkin Uluutku and Santiago D. Solares
Beilstein J. Nanotechnol. 2020, 11, 453–465.
https://doi.org/10.3762/bjnano.11.37
How to Cite
Uluutku, B.; Solares, S. D. Beilstein J. Nanotechnol. 2020, 11, 453–465. doi:10.3762/bjnano.11.37
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Scholarly Works
- Saadi, M. A. S. R.; Uluutku, B.; Parvini, C. H.; Solares, S. D. Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy. Surface Topography: Metrology and Properties 2020, 8, 045004. doi:10.1088/2051-672x/abb888
