A review of demodulation techniques for multifrequency atomic force microscopy

David M. Harcombe, Michael G. Ruppert and Andrew J. Fleming
Beilstein J. Nanotechnol. 2020, 11, 76–91. https://doi.org/10.3762/bjnano.11.8

Cite the Following Article

A review of demodulation techniques for multifrequency atomic force microscopy
David M. Harcombe, Michael G. Ruppert and Andrew J. Fleming
Beilstein J. Nanotechnol. 2020, 11, 76–91. https://doi.org/10.3762/bjnano.11.8

How to Cite

Harcombe, D. M.; Ruppert, M. G.; Fleming, A. J. Beilstein J. Nanotechnol. 2020, 11, 76–91. doi:10.3762/bjnano.11.8

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