High–low Kelvin probe force spectroscopy for measuring the interface state density

Ryo Izumi, Masato Miyazaki, Yan Jun Li and Yasuhiro Sugawara
Beilstein J. Nanotechnol. 2023, 14, 175–189. https://doi.org/10.3762/bjnano.14.18

Cite the Following Article

High–low Kelvin probe force spectroscopy for measuring the interface state density
Ryo Izumi, Masato Miyazaki, Yan Jun Li and Yasuhiro Sugawara
Beilstein J. Nanotechnol. 2023, 14, 175–189. https://doi.org/10.3762/bjnano.14.18

How to Cite

Izumi, R.; Miyazaki, M.; Li, Y. J.; Sugawara, Y. Beilstein J. Nanotechnol. 2023, 14, 175–189. doi:10.3762/bjnano.14.18

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