Quantitative wear evaluation of tips based on sharp structures

Ke Xu and Houwen Leng
Beilstein J. Nanotechnol. 2024, 15, 230–241. https://doi.org/10.3762/bjnano.15.22

Cite the Following Article

Quantitative wear evaluation of tips based on sharp structures
Ke Xu and Houwen Leng
Beilstein J. Nanotechnol. 2024, 15, 230–241. https://doi.org/10.3762/bjnano.15.22

How to Cite

Xu, K.; Leng, H. Beilstein J. Nanotechnol. 2024, 15, 230–241. doi:10.3762/bjnano.15.22

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Presentation Graphic

Picture with graphical abstract, title and authors for social media postings and presentations.
Format: PNG Size: 9.9 MB Download

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Chen, G.; Dong, E.; Liu, Y.; Zhao, L.; Chen, J.; Lei, H.; Cheng, J.; Chen, M.; Ding, W.; Liu, Q. Multiscale tribomechanical analysis of wear mechanisms of monocrystalline silicon probe on functional KDP laser optics during ink-free DPN processes. Tribology International 2025, 214, 111166. doi:10.1016/j.triboint.2025.111166
  • Lopez‐Buenafe, G. d. R.; Alonso‐Cabrera, J. A.; Marcuello, C.; Ortiz‐Perez, M.; Benito‐Lopez, F.; Colom, A.; Basabe‐Desmonts, L.; Saez, J. Fabrication and Characterization of PEDOT:PSS‐Based Microstructured Electrodes for In Vitro Cell Culture. Advanced Materials Interfaces 2025, 12. doi:10.1002/admi.202500097
  • Cheng, P.; Li, Y.; Lin, R.; Hu, Y.; Qian, J.; Chen, Y.; Yuan, Q. Fast AFM super-resolution imaging by permutation with compressed sensing reconstruction. Measurement 2025, 249, 117014. doi:10.1016/j.measurement.2025.117014
Other Beilstein-Institut Open Science Activities