Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

Bob Kyeyune, Philipp Rahe and Michael Reichling
Beilstein J. Nanotechnol. 2025, 16, 944–950. https://doi.org/10.3762/bjnano.16.72

Cite the Following Article

Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface
Bob Kyeyune, Philipp Rahe and Michael Reichling
Beilstein J. Nanotechnol. 2025, 16, 944–950. https://doi.org/10.3762/bjnano.16.72

How to Cite

Kyeyune, B.; Rahe, P.; Reichling, M. Beilstein J. Nanotechnol. 2025, 16, 944–950. doi:10.3762/bjnano.16.72

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