At the cutting edge of atomic force microscopy
PD Dr. Thilo Glatzel, University of Basel, Switzerland
Prof. Peter Grutter, McGill University, Canada
Prof. Omur Dagdeviren, École de Technologie Supérieure, University of Quebec, Canada
Prof. Shigeki Kawai, National Institute for Materials Science (NIMS), Japan
Submit your exciting research and explore the latest advances in scanning probe microscopy, more specifically, atomic force microscopy (AFM) in our new thematic issue with the Beilstein Journal of Nanotechnology. AFM is a key method for atomic and nanoscale characterization in physics, chemistry, materials science, biology and beyond. This issue features fundamental research highlighting significant improvements in sensitivity and speed, innovative experimental techniques and new applications in a wide range of fields.
Advanced studies of single spins, atoms, molecules, functional surfaces and quantum systems, as well as synergies between AFM and techniques such as scanning tunneling microscopy and THz spectroscopy are topics covered. Learn how AFM exploits a wide range of electromagnetic interactions, from spin–spin and van der Waals to electrostatic and magnetic interactions, making AFM an unprecedented tool for surface science and nanoscale analysis.
Submission deadline: December 1, 2025.
ReactorAFM/STM – dynamic reactions on surfaces at elevated temperature and atmospheric pressure
- Tycho Roorda,
- Hamed Achour,
- Matthijs A. van Spronsen,
- Marta E. Cañas-Ventura,
- Sander B. Roobol,
- Willem Onderwaater,
- Mirthe Bergman,
- Peter van der Tuijn,
- Gertjan van Baarle,
- Johan W. Bakker,
- Joost W. M. Frenken and
- Irene M. N. Groot
Beilstein J. Nanotechnol. 2025, 16, 397–406, doi:10.3762/bjnano.16.30
Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy
- Pascal N. Rohrbeck,
- Lukas D. Cavar,
- Franjo Weber,
- Peter G. Reichel,
- Mara Niebling and
- Stefan A. L. Weber
Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49
The impact of tris(pentafluorophenyl)borane hole transport layer doping on interfacial charge extraction and recombination
- Konstantinos Bidinakis and
- Stefan A. L. Weber
Beilstein J. Nanotechnol. 2025, 16, 678–689, doi:10.3762/bjnano.16.52
Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface
- Bob Kyeyune,
- Philipp Rahe and
- Michael Reichling
Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72
Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images
- Samuel Gelman,
- Irit Rosenhek-Goldian,
- Nir Kampf,
- Marek Patočka,
- Maricarmen Rios,
- Marcos Penedo,
- Georg Fantner,
- Amir Beker,
- Sidney R. Cohen and
- Ido Azuri
Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83
Automated collection and categorisation of STM images and STS spectra with and without machine learning
- Dylan Stewart Barker and
- Adam Sweetman
Beilstein J. Nanotechnol. 2025, 16, 1367–1379, doi:10.3762/bjnano.16.99
Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis
- Thomas Mathias,
- Roland Bennewitz and
- Philip Egberts
Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136
Calibration of piezo actuators and systems by dynamic interferometry
- Knarik Khachatryan and
- Michael Reichling
Beilstein J. Nanotechnol. 2025, 16, 2086–2091, doi:10.3762/bjnano.16.143
