Cite the Following Article
Advancing nanolithography: a comprehensive review of materials for local anodic oxidation with AFM
Matteo Lorenzoni
Beilstein J. Nanotechnol. 2026, 17, 275–291.
https://doi.org/10.3762/bjnano.17.19
How to Cite
Lorenzoni, M. Beilstein J. Nanotechnol. 2026, 17, 275–291. doi:10.3762/bjnano.17.19
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Scholarly Works
- Alan, B. Ö.; Li, R.; Reuter, C.; Strehle, S. $\text{MoTe}_{2}$-Based Memristor Fabricated by Scanning Probe Lithography. In 2026 IEEE 19th Dallas Circuits and Systems Conference (DCAS), IEEE, 2026; pp 1–4. doi:10.1109/dcas69364.2026.11544462
