Cite the Following Article
Fractional shot noise of an SU(N) Kondo system
Damian Krychowski and Stanisław Lipiński
Beilstein J. Nanotechnol. 2026, 17, 515–540.
https://doi.org/10.3762/bjnano.17.34
How to Cite
Krychowski, D.; Lipiński, S. Beilstein J. Nanotechnol. 2026, 17, 515–540. doi:10.3762/bjnano.17.34
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