Supporting Information
| Supporting Information File 1: Additional description of the framework. | ||
| Format: PDF | Size: 1.6 MB | Download |
| Supporting Information File 2: Videos of the translator validation testing, performed on the various microscope controllers. | ||
| Format: ZIP | Size: 63.1 MB | Download |
| Supporting Information File 3: Data collected during experimental runs and the configuration file of these. The data folder contains the experimental scans as saved during the experiment. Config.toml contains the afspm configuration file as run. scan_metadata.csv holds the metadata file created by ScanMetadataWriter. drift_correction.csv contains the logged drift correction information created by the CSCorrectedScheduler (the legacy internal name for Drift Compensated Mediator). log.txt holds all logs sent out during the experiment. | ||
| Format: ZIP | Size: 17.2 MB | Download |
Cite the Following Article
afspm: A framework for manufacturer-agnostic automation in scanning probe microscopy
Nicholas J. Sullivan, Julio J. Valdés, Kirk H. Bevan and Peter Grutter
Beilstein J. Nanotechnol. 2026, 17, 653–667.
https://doi.org/10.3762/bjnano.17.45
How to Cite
Sullivan, N. J.; Valdés, J. J.; Bevan, K. H.; Grutter, P. Beilstein J. Nanotechnol. 2026, 17, 653–667. doi:10.3762/bjnano.17.45
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Presentation Graphic
| Picture with graphical abstract, title and authors for social media postings and presentations. | ||
| Format: PNG | Size: 11.7 MB | Download |
