Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

Zsolt Majzik, Martin Setvín, Andreas Bettac, Albrecht Feltz, Vladimír Cháb and Pavel Jelínek
Beilstein J. Nanotechnol. 2012, 3, 249–259. https://doi.org/10.3762/bjnano.3.28

Cite the Following Article

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique
Zsolt Majzik, Martin Setvín, Andreas Bettac, Albrecht Feltz, Vladimír Cháb and Pavel Jelínek
Beilstein J. Nanotechnol. 2012, 3, 249–259. https://doi.org/10.3762/bjnano.3.28

How to Cite

Majzik, Z.; Setvín, M.; Bettac, A.; Feltz, A.; Cháb, V.; Jelínek, P. Beilstein J. Nanotechnol. 2012, 3, 249–259. doi:10.3762/bjnano.3.28

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