Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Adam Sweetman, Sam Jarvis, Rosanna Danza and Philip Moriarty

Beilstein J. Nanotechnol. 2012, 3, 25–32. doi:10.3762/bjnano.3.3

Supporting Information

Supporting information is available highlighting that no tunnel current was measured during the experiments performed in this paper. We also discuss the assignment of atomic positions due to the double tip present in the high-setpoint “inverted” image presented in Figure 1.

Supporting Information File 1: Complete additional experimental detail and figures
Format: PDF Size: 884.2 KB Download
Supporting Information File 2: Representative tunnel current data during zero bias imaging
Format: PNG Size: 2.9 MB Download
Supporting Information File 3: Atomic position assignment
Format: PNG Size: 823.8 KB Download
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