Supporting Information
Supporting information is available highlighting that no tunnel current was measured during the experiments performed in this paper. We also discuss the assignment of atomic positions due to the double tip present in the high-setpoint “inverted” image presented in Figure 1.
| Supporting Information File 1: Complete additional experimental detail and figures | ||
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| Supporting Information File 2: Representative tunnel current data during zero bias imaging | ||
| Format: PNG | Size: 2.9 MB | Download |
| Supporting Information File 3: Atomic position assignment | ||
| Format: PNG | Size: 823.8 KB | Download |
Cite the Following Article
Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe
Adam Sweetman, Sam Jarvis, Rosanna Danza and Philip Moriarty
Beilstein J. Nanotechnol. 2012, 3, 25–32.
https://doi.org/10.3762/bjnano.3.3
How to Cite
Sweetman, A.; Jarvis, S.; Danza, R.; Moriarty, P. Beilstein J. Nanotechnol. 2012, 3, 25–32. doi:10.3762/bjnano.3.3
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