Channeling in helium ion microscopy: Mapping of crystal orientation

Scholarly Works

• Höflich, K.; Hobler, G.; Allen, F. I.; Wirtz, T.; Rius, G.; McElwee-White, L.; Krasheninnikov, A. V.; Schmidt, M.; Utke, I.; Klingner, N.; Osenberg, M.; Córdoba, R.; Djurabekova, F.; Manke, I.; Moll, P.; Manoccio, M.; De Teresa, J. M.; Bischoff, L.; Michler, J.; De Castro, O.; Delobbe, A.; Dunne, P.; Dobrovolskiy, O. V.; Frese, N.; Gölzhäuser, A.; Mazarov, P.; Koelle, D.; Möller, W.; Pérez-Murano, F.; Philipp, P.; Vollnhals, F.; Hlawacek, G. Roadmap for focused ion beam technologies. Applied Physics Reviews 2023, 10. doi:10.1063/5.0162597
• Fan, C.; Zhao, S.; Pan, S.; He, B.; Huang, M. Helium radiation blistering mechanisms in tungsten: Ion channeling effects. Materialia 2023, 27, 101664. doi:10.1016/j.mtla.2022.101664
• Balooch, M.; Allen, F.; Popovic, M.; Hosemann, P. Mechanical and structural transformations of tungsten implanted with helium ions. Journal of Nuclear Materials 2022, 559, 153436. doi:10.1016/j.jnucmat.2021.153436
• Tabean, S.; Mousley, M.; Pauly, C.; De Castro, O.; Serralta, E.; Klingner, N.; Mücklich, F.; Hlawacek, G.; Wirtz, T.; Eswara, S. Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects. Ultramicroscopy 2021, 233, 113439. doi:10.1016/j.ultramic.2021.113439
• Audinot, J.-N.; Philipp, P.; De Castro, O.; Biesemeier, A.; Hoang, Q. H.; Wirtz, T. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope. Reports on progress in physics. Physical Society (Great Britain) 2021, 84, 105901. doi:10.1088/1361-6633/ac1e32
• Frese, N.; Schmerer, P.; Wortmann, M.; Schürmann, M.; König, M.; Westphal, M.; Weber, F.; Sudhoff, H.; Gölzhäuser, A. Imaging of SARS-CoV-2 infected Vero E6 cells by helium ion microscopy. Beilstein journal of nanotechnology 2021, 12, 172–179. doi:10.3762/bjnano.12.13
• Serralta, E.; Klingner, N.; De Castro, O.; Mousley, M.; Eswara, S.; Pinto, S. D.; Wirtz, T.; Hlawacek, G. Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector. Beilstein journal of nanotechnology 2020, 11, 1854–1864. doi:10.3762/bjnano.11.167
• Gaderbauer, W.; Arndt, M.; Truglas, T.; Steck, T.; Klingner, N.; Stifter, D.; Faderl, J.; Groiss, H. Effects of alloying elements on surface oxides of hot–dip galvanized press hardened steel. Surface and Coatings Technology 2020, 404, 126466. doi:10.1016/j.surfcoat.2020.126466
• Wong, C.-S.; Kolasinski, R.; Whaley, J. A. Quantitative investigation of surface structure and interatomic potential with impact-collision ion scattering spectroscopy. Journal of physics. Condensed matter : an Institute of Physics journal 2020, 33, 015001. doi:10.1088/1361-648x/abb897
• Hlawacek, G. Ion Microscopy. Springer Handbook of Microscopy; Springer International Publishing, 2019; pp 677–714. doi:10.1007/978-3-030-00069-1_14
• Hijazi, H.; Li, M.; Barbacci, D. C.; Schultz, A.; Thorpe, R.; Gustafsson, T.; Feldman, L. C. Channeling in the helium ion microscope. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2019, 456, 92–96. doi:10.1016/j.nimb.2019.07.002
• Ghaderzadeh, S.; Ghorbani-Asl; Kretschmer, S.; Hlawacek, G.; Krasheninnikov, A. V. Channeling effects in gold nanoclusters under He ion irradiation: insights from molecular dynamics simulations. Nanotechnology 2019, 31, 035302. doi:10.1088/1361-6528/ab4847
• Mousley, M.; Eswara, S.; De Castro, O.; Bouton, O.; Klingner, N.; Koch, C.; Hlawacek, G.; Wirtz, T. Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns. Beilstein journal of nanotechnology 2019, 10, 1648–1657. doi:10.3762/bjnano.10.160
• Lybrand, R. A.; Austin, J. C.; Fedenko, J.; Gallery, R. E.; Rooney, E.; Schroeder, P. A.; Zaharescu, D. G.; Qafoku, O. A coupled microscopy approach to assess the nano-landscape of weathering. Scientific reports 2019, 9, 5377. doi:10.1038/s41598-019-41357-0
• Wirtz, T.; De Castro, O.; Audinot, J.-N.; Philipp, P. Imaging and Analytics on the Helium Ion Microscope. Annual review of analytical chemistry (Palo Alto, Calif.) 2019, 12, 523–543. doi:10.1146/annurev-anchem-061318-115457
• van Kouwen, L. Introduction to focused ion beams, ion sources, and the nano-aperture ion source. Advances in Imaging and Electron Physics Including Proceedings CPO-10; Elsevier, 2019; Vol. 212, pp 181–216. doi:10.1016/bs.aiep.2019.09.001
• Pöpsel, C.; Becker, J.; Jeon, N.; Döblinger, M.; Stettner, T.; Gottschalk, Y. T.; Loitsch, B.; Matich, S.; Altzschner, M.; Holleitner, A. W.; Finley, J. J.; Lauhon, L. J.; Koblmüller, G. He-Ion Microscopy as a High-Resolution Probe for Complex Quantum Heterostructures in Core–Shell Nanowires. Nano letters 2018, 18, 3911–3919. doi:10.1021/acs.nanolett.8b01282
• Stehling, N.; Masters, R. C.; Zhou, Y.; O'Connell, R. F.; Holland, C.; Zhang, H.; Rodenburg, C. New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope. MRS Communications 2018, 8, 226–240. doi:10.1557/mrc.2018.75
• Hujsak, K. A.; Myers, B. D.; Grovogui, J. A.; Dravid, V. P. Stage-Rocked Electron Channeling for Crystal Orientation Mapping. Scientific reports 2018, 8, 5175. doi:10.1038/s41598-018-23413-3
• Wang, J.; Huang, S. H. Y.; Herrmann, C.; Scott, S. A.; Schiettekatte, F.; Kavanagh, K. L. Focussed helium ion channeling through Si nanomembranes. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 2018, 36, 021203. doi:10.1116/1.5020667

Explore citations to this article at