Nano-structuring, surface and bulk modification with a focused helium ion beam

Daniel Fox, Yanhui Chen, Colm C. Faulkner and Hongzhou Zhang

Beilstein J. Nanotechnol. 2012, 3, 579–585. https://doi.org/10.3762/bjnano.3.67

Supporting Information

A full size HRTEM image of an unmodified region of sample 1 is available in Figure S1. A JEMS[34] software simulation of the HRTEM images is available in Figure S2. The simulated images illustrate the effect of crystal thickness on image contrast.

Supporting Information File 1: High resolution TEM imaging and simulation.
Format: PDF Size: 484.9 KB Download

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