Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

Scholarly Works

• Murad Hasan, R. M.; Ding, F.; Sun, J.; Luo, X.; Cox, A. Nanoelectrode Lithography of Silicon Surface by Brass Stamp. Proceedings of the 7th International Conference on Nanomanufacturing (nanoMan2021); Springer Singapore, 2022; pp 239–247. doi:10.1007/978-981-19-1918-3_27
• Reiser, A.; Schuster, R.; Spolenak, R. Nanoscale electrochemical 3D deposition of cobalt with nanosecond voltage pulses in an STM. Nanoscale 2022, 14, 5579–5588. doi:10.1039/d1nr08409g
• Ruiz-Zambrana, C. L.; Malankowska, M.; Coronas, J. Metal organic framework top-down and bottom-up patterning techniques. Dalton transactions (Cambridge, England : 2003) 2020, 49, 15139–15148. doi:10.1039/d0dt02207a
• Hasan, R. M. M.; Politano, O.; Luo, X. Substrate orientation effects on nanoelectrode lithography: ReaxFF molecular dynamics and experimental study. Journal of Physics D: Applied Physics 2020, 53, 295108. doi:10.1088/1361-6463/ab86e2
• Hasan, R. M. M.; Politano, O.; Luo, X. ReaxFF molecular dynamics simulation study of nanoelectrode lithography oxidation process on silicon (100) surface. Applied Surface Science 2019, 496, 143679. doi:10.1016/j.apsusc.2019.143679
• Goldmann, A. S.; Boase, N. R. B.; Michalek, L.; Blinco, J. P.; Welle, A.; Barner-Kowollik, C. Adaptable and Reprogrammable Surfaces. Advanced materials (Deerfield Beach, Fla.) 2019, 31, 1902665. doi:10.1002/adma.201902665
• Xie, F.; Lin, X.; Gross, A.; Evers, F.; Pauly, F.; Schimmel, T. Multiplicity of atomic reconfigurations in an electrochemical Pb single-atom transistor. Physical Review B 2017, 95, 195415. doi:10.1103/physrevb.95.195415
• Ryu, Y. K.; Garcia, R. Advanced oxidation scanning probe lithography. Nanotechnology 2017, 28, 142003. doi:10.1088/1361-6528/aa5651
• Heinke, L.; Gliemann, H.; Tremouilhac, P.; Wöll, C. The Chemistry of Metal-Organic Frameworks: Synthesis, Characterization, and Applications; Wiley-VCH Verlag GmbH & Co. KGaA, 2016; pp 523–550. doi:10.1002/9783527693078.ch17
• Liu, H.; Hoeppener, S.; Schubert, U. S. Nanoscale Materials Patterning by Local Electrochemical Lithography. Advanced Engineering Materials 2016, 18, 890–902. doi:10.1002/adem.201500486
• Förste, A.; Pfirrmann, M.; Sachs, J.; Gröger, R.; Walheim, S.; Brinkmann, F.; Hirtz, M.; Fuchs, H.; Schimmel, T. Ultra-large scale AFM of lipid droplet arrays: investigating the ink transfer volume in dip pen nanolithography. Nanotechnology 2015, 26, 175303. doi:10.1088/0957-4484/26/17/175303
• Kaman, J. Young’s Modulus and Energy Dissipation Determination Methods by AFM, with Particular Reference to a Chalcogenide Thin Film. Periodica Polytechnica Electrical Engineering and Computer Science 2015, 59, 18–25. doi:10.3311/ppee.7865
• Zhong, S.; Koch, T.; Walheim, S.; Rösner, H.; Nold, E.; Kobler, A.; Scherer, T.; Wang, D.; Kübel, C.; Wang, M.; Hahn, H.; Schimmel, T. Self-organization of mesoscopic silver wires by electrochemical deposition. Beilstein journal of nanotechnology 2014, 5, 1285–1290. doi:10.3762/bjnano.5.142
• Garcia, R.; Knoll, A. W.; Riedo, E. Advanced scanning probe lithography. Nature nanotechnology 2014, 9, 577–587. doi:10.1038/nnano.2014.157
• Yan, J.; Aravamudhan, S. Nanoscience and Nanoengineering - Nano-Electro-Mechanical Systems: Processes and Devices. Nanoscience and Nanoengineering; CRC Press, 2014; pp 13–30. doi:10.1201/b16957-4
• Geng, Y.; Zhao, X.; Yan, Y.; Hu, Z. An AFM-based methodology for measuring axial and radial error motions of spindles. Measurement Science and Technology 2014, 25, 055007. doi:10.1088/0957-0233/25/5/055007
• Ladnorg, T.; Welle, A.; Heißler, S.; Wöll, C.; Gliemann, H. Site-selective growth of surface-anchored metal-organic frameworks on self-assembled monolayer patterns prepared by AFM nanografting. Beilstein journal of nanotechnology 2013, 4, 638–648. doi:10.3762/bjnano.4.71

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