Advanced atomic force microscopy techniques

Thilo Glatzel, Hendrik Hölscher, Thomas Schimmel, Mehmet Z. Baykara, Udo D. Schwarz and Ricardo Garcia
Beilstein J. Nanotechnol. 2012, 3, 893–894. https://doi.org/10.3762/bjnano.3.99

Cite the Following Article

Advanced atomic force microscopy techniques
Thilo Glatzel, Hendrik Hölscher, Thomas Schimmel, Mehmet Z. Baykara, Udo D. Schwarz and Ricardo Garcia
Beilstein J. Nanotechnol. 2012, 3, 893–894. https://doi.org/10.3762/bjnano.3.99

How to Cite

Glatzel, T.; Hölscher, H.; Schimmel, T.; Baykara, M. Z.; Schwarz, U. D.; Garcia, R. Beilstein J. Nanotechnol. 2012, 3, 893–894. doi:10.3762/bjnano.3.99

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