Influence of diffusion on space-charge-limited current measurements in organic semiconductors

Thomas Kirchartz

Beilstein J. Nanotechnol. 2013, 4, 180–188. https://doi.org/10.3762/bjnano.4.18

Supporting Information

Figure S1 shows the similarity between current–voltage curves affected by (i) a nonzero built-in voltage and (ii) space charge due to charged defects. The effect of built-in voltage on forward- and reverse-bias current–voltage curves is shown in Figure S2. Figure S3 discusses the effect of series resistances of fitting current–voltage curves with the Murgatroyd equation. Figures S4 to Figure S6 are the fits used to create Figure 5.

Supporting Information File 1: Additional simulations.
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