High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices

Pierre Eyben
Beilstein J. Nanotechnol. 2013, 4, 318–319. https://doi.org/10.3762/bjnano.4.35

Cite the Following Article

High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices
Pierre Eyben
Beilstein J. Nanotechnol. 2013, 4, 318–319. https://doi.org/10.3762/bjnano.4.35

How to Cite

Eyben, P. Beilstein J. Nanotechnol. 2013, 4, 318–319. doi:10.3762/bjnano.4.35

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