Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland
Beilstein J. Nanotechnol. 2013, 4, 45–56. https://doi.org/10.3762/bjnano.4.5

Cite the Following Article

Interpreting motion and force for narrow-band intermodulation atomic force microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland
Beilstein J. Nanotechnol. 2013, 4, 45–56. https://doi.org/10.3762/bjnano.4.5

How to Cite

Platz, D.; Forchheimer, D.; Tholén, E. A.; Haviland, D. B. Beilstein J. Nanotechnol. 2013, 4, 45–56. doi:10.3762/bjnano.4.5

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Patents

  • SERRY FARDAD MICHAEL. Harmonic feedback atomic force microscopy. US 9891246 B2, Feb 13, 2018.
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