Characterization of electroforming-free titanium dioxide memristors

John Paul Strachan, J. Joshua Yang, L. A. Montoro, C. A. Ospina, A. J. Ramirez, A. L. D. Kilcoyne, Gilberto Medeiros-Ribeiro and R. Stanley Williams

Beilstein J. Nanotechnol. 2013, 4, 467–473. https://doi.org/10.3762/bjnano.4.55

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