Imaging of carbon nanomembranes with helium ion microscopy

André Beyer, Henning Vieker, Robin Klett, Hanno Meyer zu Theenhausen, Polina Angelova and Armin Gölzhäuser

Beilstein J. Nanotechnol. 2015, 6, 1712–1720. https://doi.org/10.3762/bjnano.6.175

Supporting Information

Supporting Information File 1: Additional Experimental Information.
The supporting information provides details about the type of CNM and the employed HIM scan parameters for all presented images. Furthermore, exemplary SEM images of CNMs are shown.
Format: PDF Size: 112.4 KB Download

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