Fundamental edge broadening effects during focused electron beam induced nanosynthesis

Roland Schmied, Jason D. Fowlkes, Robert Winkler, Phillip D. Rack and Harald Plank
Beilstein J. Nanotechnol. 2015, 6, 462–471. https://doi.org/10.3762/bjnano.6.47

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Fundamental edge broadening effects during focused electron beam induced nanosynthesis
Roland Schmied, Jason D. Fowlkes, Robert Winkler, Phillip D. Rack and Harald Plank
Beilstein J. Nanotechnol. 2015, 6, 462–471. https://doi.org/10.3762/bjnano.6.47

How to Cite

Schmied, R.; Fowlkes, J. D.; Winkler, R.; Rack, P. D.; Plank, H. Beilstein J. Nanotechnol. 2015, 6, 462–471. doi:10.3762/bjnano.6.47

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