Fundamental edge broadening effects during focused electron beam induced nanosynthesis

Roland Schmied, Jason D. Fowlkes, Robert Winkler, Phillip D. Rack and Harald Plank

Beilstein J. Nanotechnol. 2015, 6, 462–471. https://doi.org/10.3762/bjnano.6.47

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Supporting Information File 1: Additional experimental data.
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Focused particle beam-induced processing

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