Noise in NC-AFM measurements with significant tip–sample interaction

Jannis Lübbe, Matthias Temmen, Philipp Rahe and Michael Reichling
Beilstein J. Nanotechnol. 2016, 7, 1885–1904. https://doi.org/10.3762/bjnano.7.181

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Noise in NC-AFM measurements with significant tip–sample interaction
Jannis Lübbe, Matthias Temmen, Philipp Rahe and Michael Reichling
Beilstein J. Nanotechnol. 2016, 7, 1885–1904. https://doi.org/10.3762/bjnano.7.181

How to Cite

Lübbe, J.; Temmen, M.; Rahe, P.; Reichling, M. Beilstein J. Nanotechnol. 2016, 7, 1885–1904. doi:10.3762/bjnano.7.181

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