Cite the Following Article
Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air
Hannes Beyer, Tino Wagner and Andreas Stemmer
Beilstein J. Nanotechnol. 2016, 7, 432–438.
https://doi.org/10.3762/bjnano.7.38
How to Cite
Beyer, H.; Wagner, T.; Stemmer, A. Beilstein J. Nanotechnol. 2016, 7, 432–438. doi:10.3762/bjnano.7.38
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