Cite the Following Article
Evaluation of preparation methods for suspended nano-objects on substrates for dimensional measurements by atomic force microscopy
Petra Fiala, Daniel Göhler, Benno Wessely, Michael Stintz, Giovanni Mattia Lazzerini and Andrew Yacoot
Beilstein J. Nanotechnol. 2017, 8, 1774–1785.
https://doi.org/10.3762/bjnano.8.179
How to Cite
Fiala, P.; Göhler, D.; Wessely, B.; Stintz, M.; Lazzerini, G. M.; Yacoot, A. Beilstein J. Nanotechnol. 2017, 8, 1774–1785. doi:10.3762/bjnano.8.179
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