Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy

Hanaul Noh, Alfredo J. Diaz and Santiago D. Solares

Beilstein J. Nanotechnol. 2017, 8, 579–589. https://doi.org/10.3762/bjnano.8.62

Supporting Information

Supporting Information contains detailed experimental setup, image cross-correlation, analysis of an aged sample, time evolution of surface aggregates, aggregate removal during KPFM scans, a typical current–voltage curve, cantilever calibration, comparison of contact-mode and bimodal AFM treatments.

Supporting Information File 1: Additional experimental data.
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