Supporting Information
Supporting Information contains detailed experimental setup, image cross-correlation, analysis of an aged sample, time evolution of surface aggregates, aggregate removal during KPFM scans, a typical current–voltage curve, cantilever calibration, comparison of contact-mode and bimodal AFM treatments.
| Supporting Information File 1: Additional experimental data. | ||
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Cite the Following Article
Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy
Hanaul Noh, Alfredo J. Diaz and Santiago D. Solares
Beilstein J. Nanotechnol. 2017, 8, 579–589.
https://doi.org/10.3762/bjnano.8.62
How to Cite
Noh, H.; Diaz, A. J.; Solares, S. D. Beilstein J. Nanotechnol. 2017, 8, 579–589. doi:10.3762/bjnano.8.62
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