Supporting Information
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Cite the Following Article
A robust AFM-based method for locally measuring the elasticity of samples
Alexandre Bubendorf, Stefan Walheim, Thomas Schimmel and Ernst Meyer
Beilstein J. Nanotechnol. 2018, 9, 1–10.
https://doi.org/10.3762/bjnano.9.1
How to Cite
Bubendorf, A.; Walheim, S.; Schimmel, T.; Meyer, E. Beilstein J. Nanotechnol. 2018, 9, 1–10. doi:10.3762/bjnano.9.1
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