A robust AFM-based method for locally measuring the elasticity of samples

Alexandre Bubendorf, Stefan Walheim, Thomas Schimmel and Ernst Meyer
Beilstein J. Nanotechnol. 2018, 9, 1–10. https://doi.org/10.3762/bjnano.9.1

Supporting Information

Supporting Information File 1: Supporting information features the analytical expression for normal sample stiffness based on Hurley and Turner’s equations.
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A robust AFM-based method for locally measuring the elasticity of samples
Alexandre Bubendorf, Stefan Walheim, Thomas Schimmel and Ernst Meyer
Beilstein J. Nanotechnol. 2018, 9, 1–10. https://doi.org/10.3762/bjnano.9.1

How to Cite

Bubendorf, A.; Walheim, S.; Schimmel, T.; Meyer, E. Beilstein J. Nanotechnol. 2018, 9, 1–10. doi:10.3762/bjnano.9.1

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