Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire

Tino Wagner, Fabian Menges, Heike Riel, Bernd Gotsmann and Andreas Stemmer

Beilstein J. Nanotechnol. 2018, 9, 129–136. doi:10.3762/bjnano.9.15

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Supporting Information File 1: Additional SEM and AFM measurements, a description of the resistivity reconstruction method, derivation of the transmission line method, and details about the simulation and fit of temperature profiles.
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