A variable probe pitch micro-Hall effect method

Maria-Louise Witthøft, Frederik W. Østerberg, Janusz Bogdanowicz, Rong Lin, Henrik H. Henrichsen, Ole Hansen and Dirch H. Petersen
Beilstein J. Nanotechnol. 2018, 9, 2032–2039. https://doi.org/10.3762/bjnano.9.192

Cite the Following Article

A variable probe pitch micro-Hall effect method
Maria-Louise Witthøft, Frederik W. Østerberg, Janusz Bogdanowicz, Rong Lin, Henrik H. Henrichsen, Ole Hansen and Dirch H. Petersen
Beilstein J. Nanotechnol. 2018, 9, 2032–2039. https://doi.org/10.3762/bjnano.9.192

How to Cite

Witthøft, M.-L.; Østerberg, F. W.; Bogdanowicz, J.; Lin, R.; Henrichsen, H. H.; Hansen, O.; Petersen, D. H. Beilstein J. Nanotechnol. 2018, 9, 2032–2039. doi:10.3762/bjnano.9.192

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Presentation Graphic

Picture with graphical abstract, title and authors for social media postings and presentations.
Format: PNG Size: 992.6 KB Download

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Lamba, N.; Guralnik, B.; Beltrán-Pitarch, B.; Rosendal, V.; Pryds, N.; Hansen, O.; Petersen, D. H. Deconvolution of heat sources for application in thermoelectric micro four-point probe measurements. International Journal of Thermal Sciences 2024, 196, 108716. doi:10.1016/j.ijthermalsci.2023.108716
  • Szymański, K. R.; Zaleski, P. A.; Kondratiuk, M. Five-probe method for finite samples - an enhancement of the van der Pauw method. Measurement 2023, 217, 113039. doi:10.1016/j.measurement.2023.113039
  • Beltrán-Pitarch, B.; Guralnik, B.; Lamba, N.; Stilling-Andersen, A. R.; Nørregaard, L.; Hansen, T. M.; Hansen, O.; Pryds, N.; Nielsen, P. F.; Petersen, D. H. Determination of thermal diffusivity of thermoelectric materials using a micro four-point probe method. Materials Today Physics 2023, 31, 100963. doi:10.1016/j.mtphys.2022.100963
  • Guralnik, B.; Nielsen, P. F.; Petersen, D. H.; Hansen, O.; Shiv, L.; Wei, W.; Marangoni, T. A.; Buron, J. D.; Osterberg, F. W.; Lin, R.; Henrichsen, H. H.; Hansen, M. F. Review of Micro- and Nanoprobe Metrology for Direct Electrical Measurements on Product Wafers. In 2022 China Semiconductor Technology International Conference (CSTIC), IEEE, 2022. doi:10.1109/cstic55103.2022.9856824
Other Beilstein-Institut Open Science Activities