Beilstein J. Nanotechnol. 2018, 9, 2087–2096. https://doi.org/10.3762/bjnano.9.197
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Figure S1 shows a FM-AFM height image obtained in UHV astride the step from a nanostructured TiO2/P3HT-COOH HHJ to the ITO electrode lying below. The applied DC sample bias was varied during the measurement, without illumination. This result aims at demonstrating the absence of floating potential across the layer composing the sample. Figure S2 shows the superimposition of FM-KPFM height and Vcpd profiles over a nanostructured TiO2 film obtained in UHV and recorded with and without illumination. The result aimed at demonstrating the absence of light-induced artefact during the recording of topography, as well as the negligibility of the photovoltaic effect at the TiO2/ITO interface. |
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Philippe Leclère, Rüdiger Berger, Benjamin Grévin and Yi Zhang