Cite the Following Article
Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films
Daiki Katsube, Hayato Yamashita, Satoshi Abo and Masayuki Abe
Beilstein J. Nanotechnol. 2018, 9, 686–692.
https://doi.org/10.3762/bjnano.9.63
How to Cite
Katsube, D.; Yamashita, H.; Abo, S.; Abe, M. Beilstein J. Nanotechnol. 2018, 9, 686–692. doi:10.3762/bjnano.9.63
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- Katsube, D.; Shimizu, R.; Sugimoto, Y.; Hitosugi, T.; Abe, M. Identification of OH groups on SrTiO3(100)-(13×13)-R33.7° reconstructed surface by non-contact atomic force microscopy and scanning tunneling microscopy. Applied Physics Letters 2023, 122. doi:10.1063/5.0139493
- KATSUBE, D.; OHNO, S.; INAMI, E.; YOSHIGOE, A.; ABE, M. Restoration of Oxygen Vacancies on an Anatase TiO2(001) Surface with Supersonic Seeded Oxygen Molecular Beam. Vacuum and Surface Science 2022, 65, 526–530. doi:10.1380/vss.65.526
- Abe, M.; Yamashita, H.; Jinno, S.; Custance, O.; Toki, H. Reduction of noise induced by power supply lines using phase-locked loop. The Review of scientific instruments 2022, 93, 113704. doi:10.1063/5.0124433
- Abe, M.; Katsube, D.; Yamashita, H.; Inami, E.; Custance, O. Method and Applications for New Material Science on Nanoscale Structures and Functions of Crystal Defect Cores. Materia Japan 2022, 61, 645–650. doi:10.2320/materia.61.645
- Katsube, D.; Ohno, S.; Takayanagi, S.; Ojima, S.; Maeda, M.; Origuchi, N.; Ogawa, A.; Ikeda, N.; Aoyagi, Y.; Kabutoya, Y.; Kyungmin, K.; Linfeng, H.; Fengxuan, L.; Tsuda, Y.; Yoshida, H.; Nishi, S.; Sakamoto, T.; Inami, E.; Yoshigoe, A.; Abe, M. Oxidation of Anatase TiO2(001) Surface Using Supersonic Seeded Oxygen Molecular Beam. Langmuir : the ACS journal of surfaces and colloids 2021, 37, 12313–12317. doi:10.1021/acs.langmuir.1c01752
- Chlanda, A.; Walejewska, E.; Kowiorski, K.; Heljak, M.; Swieszkowski, W.; Lipińska, L. Investigation into morphological and electromechanical surface properties of reduced-graphene-oxide-loaded composite fibers for bone tissue engineering applications: A comprehensive nanoscale study using atomic force microscopy approach. Micron (Oxford, England : 1993) 2021, 146, 103072. doi:10.1016/j.micron.2021.103072
- Yamashita, H.; Handa, N.; Higashiura, Y.; Abe, M. Flexure Structural Scanner of Tip Scan Type for High-speed Scanning Tunneling Microscopy. e-Journal of Surface Science and Nanotechnology 2020, 18, 146–151. doi:10.1380/ejssnt.2020.146
- Katsube, D.; Ojima, S.; Inami, E.; Abe, M. Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy. Beilstein journal of nanotechnology 2020, 11, 443–449. doi:10.3762/bjnano.11.35
- Katsube, D.; Abe, M. “Dual contrast mode” imaging of anatase TiO2(001) − (1 × 4) reconstructed surface using non-contact atomic force microscopy. Japanese Journal of Applied Physics 2019, 58, SIIA11. doi:10.7567/1347-4065/ab1071
- Katsube, D.; Abe, M. Imaging patterns of anatase TiO2(001) with non-contact atomic force microscopy. Nanotechnology 2019, 30, 215704. doi:10.1088/1361-6528/ab02a7
- Katsube, D.; Abe, M. High-resolution imaging of LaAlO 3 (100)-(1 × 4) reconstructed surface using non-contact atomic force microscopy. Applied Physics Letters 2018, 113, 031601. doi:10.1063/1.5037741