1 article(s) from Bevan, Kirk H

afspm: A framework for manufacturer-agnostic automation in scanning probe microscopy

  • Nicholas J. Sullivan,
  • Julio J. Valdés,
  • Kirk H. Bevan and
  • Peter Grutter

Beilstein J. Nanotechnol. 2026, 17, 653–667, doi:10.3762/bjnano.17.45

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Published 18 May 2026
 
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